In the field of scanning electron microscopy (SEM), the electron backscatter diffraction (EBSD) method has developed into a robust tool for the crystallographic analysis of materials. Specifically, ...
Researchers have developed an atom-diffraction imaging method with micrometer spatial resolution, which may allow new applications in material characterization. Microscopy with atoms offers new ...
Every lens has a sweet spot, the aperture where the image sharpness is at its best. If the aperture becomes larger, lens errors will become visible. When the aperture is closed, lens diffraction will ...
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