NARRATOR: That ice cream dispenser is out of control Frank! Let’s look at how it’s set up. We can see it’s a series circuit because everything is connected to one path. The power is coming ...

Overlay (OVL) is a key index in lithography, which will determine product quality, and its measurement is affected by many factors, such as measurement tool, measurement strategy, OVL mark and STI CMP ...

Immersion lithography has recently emerged as the leading candidate for extending 193 nm lithography to the 45 nm lithography node and beyond. By immersing the wafer in a high index fluid, lens ...

Developing a method to pattern organic molecules, particularly on the sub-100-nm scale, is of wide interest in current nanoscience for a broad range of technological applications. Because of the ...